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OHAA-810 Atomic Absorption Spectrophotometer
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The OHAA-810 is an Atomic Absorption Spectrophotometer (AAS) designed for high-precision elemental analysis. It utilizes a single flame working mode (air-acetylene) and a high-efficiency glass atomizer to detect trace levels of metals, such as Copper ($Cu$), with high sensitivity.
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Description
 Technical Parameters
| OHAA-810 | ||
| Instrument type | Working mode | single flame |
| Mode switching | — | |
| Working conditions | Working environment | Temperature: 15~35℃ |
| Relative humidity: <85% | ||
| Working power supply | 220±22V, 50±1Hz | |
| Light source/Optical system | Type of lamp | HCL-8 lamp position; Lamps preheating at the same time |
| Coding lamp | No | |
| Slit | 0.2, 0.4, 1.0, 2.0nm | |
| Monochromator | Single beam | |
| Grating: 1800 scribed lines/mm | ||
| Czerny-turner optical path design | ||
| Focal length: 270mm | ||
| Detector | Photomultiplier tube | |
| Background deduction method | Deuterium lamp | |
| Flame atomization system | Atomizer | High-efficiency glass atomizer |
| Combustion head | 10cm all titanium | |
| Burner adjustment | Manually adjust the height, front and rear positions, and deflection angle | |
| Type of flame | Air-acetylene | |
| Setting of combustion conditions | Three way gas design | |
| Rotary flowmeter controls gas and auxiliary gas | ||
| Ignition mode | Automatic ignition | |
| Hydride generator | Optional | |
| Automatic flame sampler | Optional | |
| Flame system safety | Gas/auxiliary gas pressure monitoring; Flame monitoring; Water seal monitoring;Â Waste liquid level monitoring | |
| Graphite furnace atomization system | Graphite furnace power supply | — |
| Heating mode | — | |
| Mode of temperature rise | — | |
| Heating rate | — | |
| Temperature range | — | |
| Temperature calibration | — | |
| Automatic sampler | — | |
| — | ||
| Carrier gas flow control | — | |
| Injection visualization system | — | |
| Graphite furnace system safety | — | |
| Technical indicators | Wavelength range | 190~900nm |
| Spectral bandwidth deviation | ≤±0.02nm | |
| Wavelength indication error | ≤±0.1nm | |
| Repeatability of wavelength | ≤0.1nm | |
| Baseline stability | Instantaneous noise≤ 0.003A/15min | |
| Zero drift≤ 0.003A/15min | ||
| Repeatability (RSD) | Cu≤0.6% | |
| Detection limit | Cu≤0.003µg/mL | |
| Linear error | ≤10% | |
| Background correction capability | ≥50 times | |
| Data processing system | Highly automated software | Automatic signal acquisition; Automatic plotting of standard curve; Automatic calculation of actual sample content,RSD,DL,correlation coefficient and characteristic quantity; Custom Analysis Report |
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